What can Tosca AFM do for your analysis? An introduction
In this webinar, we take a look at various published examples of different sample properties that can be analyzed using atomic force microscopy in order to gain valuable insight about the sample surface. We also show operation with Tosca AFM and how it differentiates from other AFMs available on the market. In this webinar you will learn:
- Which main sample properties can be analyzed by AFM demonstrated with various research examples
- The possibility to measure different sample properties on the same location with the same hardware set-up
- About Tosca series AFM operation and how its innovative features can improve your teams’ AFM analysis
2020-07-22, 09:00 - 09:30 (CEST UTC+02:00)
Docente: Dr. Dr. Jelena Fischer
Jelena Fischer studied Chemistry in Chicago, received her PhD from Graz University of Technology and has subsequently been a visiting scientist at the University of California at Davis. She has published scientific work in top-notch journals such as Science and is the co-inventor of two patented inventions. Her second PhD is in Engineering Management, which has been the major focus of her work over the past 10 years. She joined Anton Paar in 2012 and is the Product Manager for Tosca Series AFM.
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