Complete AFM Analysis: Measure Different Sample Properties with a Single Hardware set-up

Complete AFM Analysis: Measure Different Sample Properties with a Single Hardware set-up

Descrizione:

In this webinar we embark on a journey of investigating various sample properties on the same sample location with a single hardware set-up by using Tosca AFM. On the example of a thin film polymer blend, we stepweise learn more and more about the sample, each step revealing different qualitative and quantitative sample properties, until we have gained all the information we need to unambiguosly characterize the sample. Sounds like a complete, but lengthy analysis? We perform all the measurements in a short time without any hardware changes!

Data: 2020-07-29, 09:00 - 09:30 (CEST UTC+02:00)
Lingua: English
Docente: Dr. Dr. Jelena Fischer

Jelena Fischer studied Chemistry in Chicago, received her PhD from Graz University of Technology and has subsequently been a visiting scientist at the University of California at Davis. She has published scientific work in top-notch journals such as Science and is the co-inventor of two patented inventions. Her second PhD is in Engineering Management, which has been the major focus of her work over the past 10 years. She joined Anton Paar in 2012 and is the Product Manager for Tosca Series AFM.

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