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AFM made easy


Until recently atomic force microscopes were complex to operate and required specialized operators. Recognizing the growing demand for complex nano surface analysis in the industry, Anton Paar is proud to introduce the new Tosca TM 400 AFM. 

Join us to discover the first atomic force microscope specifically designed for industrial users. Following a quick refresher on the principles of the AFM, the webinar will present the features that make the Tosca TM 400 the easiest AFM to use. 

The unique combination of premium technology with unrivalled ease of use makes it the first AFM that is fit for industrial users as well as scientists. It employs a new form of automation on every level of operation to increase the efficiency and simplify the handling of your AFM measurements.

Date: 2018-06-20, 13:00 - 14:00
Language: English
Trainer: Warren Denning

Warren Denning is a Product Specialist for the indentation / scratch / tribology and AFM instruments of Anton Paar USA. Warren received his Bachelor's degree in Material Science and Engineering from Virginia Tech. He is responsible for assisting users with questions on theory, instrumentation, and experimental design.

Contact person and registration:
Hayley Gilbert
Tel.: +1 - 804 - 550 - 1051[at]