3 Key Developments in Atomic Force Microscopy
This presentation will highlight three novel developments in Atomic Force Microscope (AFM) technology and instrumentation. The webinar will first introduce the Probemaster, a novel tool for loading cantilevers that eliminates costly breakages. Then, we will describe the fully automated, 1-click laser alignment process that facilitates fast and accurate measurements. Finally, the novel, self-guided software interface that simplifies the measuring process and enables everyone from an intern to the CEO to obtain high quality data will be highlighted.
In this webinar you'll learn:
- How the new Probemaster tool enables cantilever loading without ever breaking a tip.
- How automatic laser alignment combined with a side-view camera enable fast and accurate analysis of difficult to image materials or surfaces.
- How a novel user interface enables AFM to be mastered in a few minutes by everyone in a company or university from an Intern to the CEO.
2019-08-29, 14:00 - 15:00
Referent: Warren Denning
Warren Denning is a Product Specialist for the indentation / scratch / tribology and AFM instruments of Anton Paar USA. Warren received his Bachelor's degree in Material Science and Engineering from Virginia Tech. He is responsible for assisting users with questions on theory, instrumentation, and experimental design.
Kontaktperson und Anmeldung:
Tel.: +1 - 804 - 550 - 1051
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