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Particle Characterization

Particle Characterization

Particle analysis at the touch of a button

Particle systems can be complex, but measuring them doesn’t have to be! Anton Paar now introduces particle characterization via light-scattering technology, realized in a system with ingeniously simple software. You can count on state-of-the-art particle analysis at the touch of a button.

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5 Reasons

Two instruments, up to four modes

The Litesizer™ particle analyzers open up many particle analysis options for you: You can use the instruments in up to four different modes to measure particle size, zeta potential, molecular mass and transmittance.

Intuitive software with one-page workflow

All input parameters, measurements and analyses appear on a single page, so all important information is at hand. Measurement series, customizable reports, audit trails and traceability are all at your fingertips. With this intuitive software, you are free to concentrate on what your particles are doing instead of trying to figure out how to use the instrument.

Continuous transmittance measurements

You get instant insight into your sample’s suitability for particle characterization from continuous transmittance measurements. In addition, the Litesizer™ particle analyzers use the transmittance to select the best parameters for your analysis (attenuation, focus position, measurement angle and duration).

The optical bench

The instrument’s highly sensitive measurement optics, mounted in a tightly encased optical bench, enable the accurate detection of even low-intensity signals. The robust casing reduces the effects of vibrations and ensures that measurements remain unaffected by dust or temperature fluctuations.

Patented zeta-potential technology

The patented cmPALS technology from Anton Paar overcomes the limitation of existing PALS technology (short measuring intervals). cmPALS provides greater sensitivity and stability of the laser-Doppler electrophoresis measurements. In this way, accurate results can be obtained in shorter times and with lower applied electric fields.